Old Web
English
Sign In
Acemap
>
authorDetail
>
Clarice Di Martino
Clarice Di Martino
STMicroelectronics
Power MOSFET
reverse bias
Nanoscopic scale
Materials science
Engineering physics
2
Papers
0
Citations
0
KQI
Citation Trend
Filter By
Interval:
1900~2024
1900
2024
Author
Papers (2)
Sort By
Default
Most Recent
Most Early
Most Citation
No data
Journal
Conference
Others
Nanoscale Insights on the Origin of the Power MOSFETs Breakdown after Extremely Long High Temperature Reverse Bias Stress
2020
Materials Science Forum
Patrick Fiorenza
M. Alessandrino
B. Carbone
Clarice Di Martino
Alfio Russo
Mario Saggio
Carlo Venuto
Edoardo Zanetti
Corrado Bongiorno
Filippo Giannazzo
Fabrizio Roccaforte
Show All
Source
Cite
Save
Citations (0)
Nanoscale Insights on the Origin of the Power MOSFETs Breakdown after Extremely Long High Temperature Reverse Bias Stress
2020
Materials Science Forum
Patrick Fiorenza
Mario S Alessandrino
B. Carbone
Clarice Di Martino
Alfio Russo
Mario Saggio
Carlo Venuto
Edoardo Zanetti
Corrado Bongiorno
Filippo Giannazzo
Fabrizio Roccaforte
Show All
Source
Cite
Save
Citations (0)
1