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Wei Jinghe

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Effects of TID radiation on P+ ion-implanted HVNMOS devices

2020 Microelectronics Reliability
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14 BIT 250 MS / S電気パイプライン型ADCの全定制レイアウト【JST・京大機械翻訳】

2016
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Low power design and implementation for a SoC

2008 SSICT | International Conference on Solid-State and Integrated Circuits Technology
- Yu Zhiguo
- Wei Jinghe
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