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Marc Porti

Autonomous University of Barcelona

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Exploiting the KPFM capabilities to analyze at the nanoscale the impact of electrical stresses on OTFTs properties

2021 Solid-state Electronics
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Methodology for the Simulation of the Variability of MOSFETs With Polycrystalline High-k Dielectrics Using CAFM Input Data

2021 IEEE Access
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MIS structures with interfacial graphene for ReRAM applications: a nanoscale and device level characterization

2020 EUROSOI-ULIS | Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon
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Low-Power, High-Performance, Non-volatile Inkjet-Printed HfO2-Based Resistive Random Access Memory: From Device to Nanoscale Characterization

2019 ACS Applied Materials & Interfaces
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Si-nc(ナノ結晶)系メモリ金属-酸化物-半導体デバイスのナノスケールでの電気特性評価

2007 Journal of Applied Physics
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