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R. Hsieh
R. Hsieh
TSMC
AND gate
Electronic engineering
Physics
Chip
Static random-access memory
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Consideration of BTI variability and product level reliability to expedite advanced FinFET process development
2016
IEDM | International Electron Devices Meeting
Y.-H. Lee
Jian-Hsing Lee
Y.F. Wang
R. Hsieh
Y. S. Tsai
Kevin Huang
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Citations (13)
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