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C. J. Buckley
C. J. Buckley
Brookhaven National Laboratory
Scanning confocal electron microscopy
Analytical chemistry
Microscopy
X-ray
Scanning ion-conductance microscopy
2
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25
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Scanning X-Ray Microscopy
1990
C. J. Buckley
H. Rarback
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Soft‐x‐ray imaging with the 35 period undulator at the NSLS
1989
Review of Scientific Instruments
C. J. Buckley
H. Rarback
R. Alforque
Deming Shu
Harald Ade
S. Hellman
N. Iskander
Janos Kirz
S. Lindaas
Ian McNulty
M. Oversluizen
E. Tang
David T. Attwood
R. DiGennaro
Malcolm R. Howells
Chris Jacobsen
Y. Vladimirsky
Stephen Rothman
D. P. Kern
David Sayre
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Citations (22)
1