Old Web
English
Sign In
Acemap
>
authorDetail
>
I. Tee
I. Tee
Chartered Semiconductor Manufacturing
Electronic engineering
Logic gate
Materials science
Process optimization
Manufacturing
1
Papers
3
Citations
0
KQI
Citation Trend
Filter By
Interval:
1900~2024
1900
2024
Author
Papers (1)
Sort By
Default
Most Recent
Most Early
Most Citation
No data
Journal
Conference
Others
Physical characterization challenges in 45 nm technology node
2008
IPFA | International Symposium on the Physical and Failure Analysis of Integrated Circuits
K. Li
P. Liu
Q.F. Wang
I. Tee
J. Teong
Show All
Source
Cite
Save
Citations (3)
1