Old Web
English
Sign In
Acemap
>
authorDetail
>
Zamir Abraham
Zamir Abraham
Applied Materials
Engineering
Optical proximity correction
Engineering drawing
Process control
Wafer
4
Papers
15
Citations
0.00
KQI
Citation Trend
Filter By
Interval:
1900~2024
1900
2024
Author
Papers (4)
Sort By
Default
Most Recent
Most Early
Most Citation
No data
Journal
Conference
Others
Using Design Intent to Qualify and Control Lithography Manufacturing
2011
Jim Vasek
Bill Wilkinson
Dave Smith
Al Reich
Cesar Garza
Jim Wiley
Joyce Zhao
Moshe Poyastro
Brian Troy
Youval Nehmadi
Zamir Abraham
Show All
Source
Cite
Save
Citations (5)
Using design intent to qualify and control lithography manufacturing
2006
Jim Vasek
Bill Wilkinson
Al Reich
Cesar Garza
Joyce Zhao
Jim Wiley
Moshe Poyastro
Brian Troy
Youval Nehmadi
Zamir Abraham
Show All
Source
Cite
Save
Citations (6)
Automatic CD-SEM offline recipe creation for OPC qualification and process monitoring in a DRAM pilot-fab environment
2006
Uwe Kramer
Thomas Marschner
Dieter Kaiser
Marc Winking
Christian Stief
Stefano Ventola
Dan Lewitzki
Zamir Abraham
Ovadya Menadeva
Sam Shukrun
Show All
Source
Cite
Save
Citations (2)
SEM defect review and classification for semiconductor device manufacturing
2001
Zamir Abraham
Show All
Source
Cite
Save
Citations (2)
1