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E J. Hohn
E J. Hohn
Radiochemistry
Leakage (electronics)
Dopant
Cobalt
Annealing (metallurgy)
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Effects of Cobalt Silicidation on the Electrical Characteristics of Shallow p*n Junctions Formed by Implantation into Thin Polycrystalline Si Films
1995
Alfred G. Emslie
E T. Bornner
L. G. Peck
E J. Hohn
J. Paint
J. Brandrup
E. H. Immergut
M. D. Bullwinkel
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