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R. Garcia
R. Garcia
Texas Instruments
Electronic engineering
Megabit
Read-only memory
Engineering
memory testing
2
Papers
25
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A Screening Methodology for VMIN Drift in SRAM Arrays with Application to Sub-65nm Nodes
2006
IEDM | International Electron Devices Meeting
M. Ball
J. Rosal
Randy Mckee
Wk. Loh
Theodore W. Houston
R. Garcia
Jayesh C. Raval
D. Li
R. Hollingsworth
R. Gury
Robert H. Eklund
J. Vaccani
B. Castellano
F. Piacibello
S. Ashburn
Alwin J. Tsao
Anand T. Krishnan
Jay Ondrusek
T. Anderson
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Infrastructure for successful BEOL characterization and yield ramp at the 65 nm node and below
2005
IITC | International Interconnect Technology Conference
Jeffrey R. DeBord
T. Grice
R. Garcia
Greg Yeric
E. Cohen
A. Sutandi
John Garcia
Gary Green
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Citations (11)
1