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John Hryn
John Hryn
Argonne National Laboratory
Optoelectronics
Chemistry
Biasing
Electronic engineering
Monolithic microwave integrated circuit
3
Papers
5
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0
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Neutron radiation hardness testing of 650V / 7.5 A GaN power HEMT
2020
Radiation Physics and Chemistry
Moinuddin Ahmed
B. Kucukgok
Angel Yanguas-Gil
John Hryn
S.A. Wender
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Citations (3)
Monolithic Integration of Self-Biased C-band Circulator on SiC Substrate for GaN MMIC Applications
2019
IEEE Electron Device Letters
Yongjie Cui
Yuepeng Zhang
Larry Witkowski
Soack D. Yoon
Subrahmanyam Pilla
Edward Beam
Andy Xie
Shuoqi Chen
Andrew Ketterson
Cathy Lee
Yunsong Xie
Kaizhong Gao
John Hryn
Yu Cao
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Citations (1)
Reliability experimentation of 1200 V SiC power n-MOSFETs by accelerated thermal aging and bias temperature instability
2019
Moinuddin Ahmed
Bahadir Kucukgok
Angel Yanguas-Gil
John Hryn
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