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X.G. Tang
X.G. Tang
Hunan Institute of Engineering
Analytical chemistry
Microstructure
Thin film
Coercivity
Dielectric
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The effect of thickness on the dielectric properties of highly (111) oriented Pb(Zr 0.53 Ti 0.47 )O 3 thin films prepared by a simple sol-gel route
2003
Microelectronic Engineering
X.G. Tang
L.L. Jiang
Aili Ding
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