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Christina Seidlick
Christina Seidlick
Goddard Space Flight Center
Field-programmable gate array
Single event upset
Electronic engineering
Physics
Probability theory
3
Papers
8
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Single Event Induced Multiple Bit Errors and the Effects of Logic Masking
2013
IEEE Transactions on Nuclear Science
Melanie D. Berg
Hak S. Kim
Anthony D. Phan
Christina Seidlick
Kenneth A. LaBel
Jonathan A. Pellish
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Citations (3)
Characterizing the Effects of Single Event Upsets on Synchronous Data Paths
2013
IEEE Transactions on Nuclear Science
Melanie D. Berg
M. Friendlich
Hak S. Kim
Christina Seidlick
Kenneth A. LaBel
Ray Ladbury
Jonathan A. Pellish
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Citations (3)
Incorporating Probability Models of Complex Test Structures to Perform Technology Independent FPGA Single Event Upset Analysis
2011
Melanie D. Berg
Hak S. Kim
M. A. Friendlich
Christopher E. Perez
Christina Seidlick
Kenneth A. LaBel
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Citations (2)
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