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Steven Hoffmann
Steven Hoffmann
IBM
Atomic physics
Heat transfer coefficient
Single crystal
Thermal effective mass
Semiconductor
2
Papers
166
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Two-dimensional surface dopant profiling in silicon using scanning Kelvin probe microscopy
1995
Journal of Applied Physics
Albert K. Henning
Todd Hochwitz
James A. Slinkman
James M. Never
Steven Hoffmann
Phil Kaszuba
Charles P. Daghlian
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Citations (166)
1827 Heat and mass transfer in semiconductor melts during single-crystal
1995
Koichi Kakimoto
Don Mark Lipkin
David R. Clarke
Kwok-Keung Law
Annemie Bogaerts
R. Gijbels
Albert K. Henning
Todd Hochwitz
James A. Slinkman
Steven Hoffmann
Phil Kaszuba
Charles P. Daghlian
Ibrahim S. Abdulhalim
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