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Yasuhiro Fukuda

Oki Electric Industry

7

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ESD protection design using a mixed-mode simulation for advanced devices

2004 EOS/ESD | Electrical Overstress/Electrostatic Discharge Symposium
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Deoxidization of Water Desorbed from APCVD TEOS-O3 SiO2 by Titanium Cap Layer

1995 IRPS | International Reliability Physics Symposium
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Deoxidization of water desorbed from APCVD TEOS-O/sub 3/ SiO/sub 2/ by titanium cap layer

1995 IRPS | International Reliability Physics Symposium
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Analysis of Electromigmtion-Induced Failures in Multilavered Interconnects

1993 IEEE Transactions on Electron Devices
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Analysis of electromigration-induced failures in multilayered interconnects

1993 IEEE Transactions on Electron Devices
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