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John D. Woodhouse
John D. Woodhouse
MESFET
Ion implantation
Hall effect
Analytical chemistry
Focused ion beam
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Dose‐rate effects in focused‐ion‐beam implantation of Si into GaAs
1991
Journal of Vacuum Science & Technology B
H. Lezec
Christian R. Musil
John Melngailis
L. J. Mahoney
John D. Woodhouse
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