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F.J. Shiu
F.J. Shiu
Electronic engineering
Tin
Materials science
Dram
Optoelectronics
2
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A Highly Reliable TiN/Al2O3/TiN MIM Technology for Embedded DRAMs
2003
The Japan Society of Applied Physics
L. L. Chao
C.D. Wu
H. L. Lin
Y. L. Tu
K. Y. Lin
C. Y. Yu
C.Y. Chen
F.J. Shiu
C.T. Ho
C.S. Tsai
S.-G. Wuu
C. Wang
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