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Mike Stekelenburg
Mike Stekelenburg
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12
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Atomic Scale Analysis of Planar Defects in Polycrystalline Diamond
2006
Microscopy and Microanalysis
Rolf Erni
Bert Freitag
Peter Hartel
Heiko Müller
Peter Christiaan Tiemeijer
Michiel van der Stam
Mike Stekelenburg
Dominique Hubert
P. Specht
Vincente Garibay-Febles
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Citations (11)
16:9 aspect ratio for broadcast applications and its consequences for new CCD imagers
1993
Martien van de Steeg
Noortje J. Daemen
Wim F. Huinink
Laurens Korthout
Herman L. Peek
Mike Stekelenburg
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Citations (1)
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