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S. Escoubas

Aix-Marseille University

49

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Erratum: “Electrical and ion beam analyses of yttrium and yttrium-titanium getter thin films oxidation” [J. Vac. Sci. Technol. B 39, 054202 (2021)]

2021 Journal of Vacuum Science & Technology. B. Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena
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Electrical and ion beam analyses of yttrium and yttrium-titanium getter thin films oxidation

2021 Journal of Vacuum Science & Technology. B. Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena
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Electrical and ion beam analyses of Yttrium and Yttrium-Titanium getter thin films oxidation

2021 Journal of Vacuum Science and Technology
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Raw and processed data used in the simultaneous analysis of electrical characteristics and microstructure of crystallised PEDOT:PSS based OECTs under strain

2021 Data in Brief
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Berkovich nanoindentation study of 16 nm Cu/Nb ARB nanolaminate: Effect of anisotropy on the surface pileup

2021 MRS Advances
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Simultaneous measurement of electrical characteristics and microstructure of crystallised PEDOT:PSS based OECTs under strain

2021 Organic Electronics
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In situ measurements of the structure and strain of a π-conjugated semiconducting polymer under mechanical load

2020 Journal of Applied Physics
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Direct Observations of the Structural Properties of Semiconducting Polymer: Fullerene Blends under Tensile Stretching

2020 Materials
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New insights into thermomechanical behavior of GeTe thin films during crystallization

2020 Acta Materialia
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In situ monitoring of stress change in GeTe thin films during thermal annealing and crystallization

2018
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