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D. L. Leung

5

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22

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Les unités Accidents Vasculaires Cérébraux

2001
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Application of Photoemission Microscopy and Focused Ion Beam Microsurgery to an Investigation of Latchup

1996
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Single ion induced multiple-bit upset in IDT 256K SRAMs

1993 RADECS | European Conference on Radiation and Its Effects on Components and Systems
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Characterization of transistors fabricated in solid-phase epitaxially regrown material

1991 SOI | International SOI Conference
- D. L. Leung
- D.C. Mayer
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VLSI microelectronics research

1991
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