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B. Jose
B. Jose
Indian Institute of Technology Bombay
Analytical chemistry
Duty cycle
Experimental data
Negative-bias temperature instability
Electronic engineering
2
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279
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A comprehensive AC / DC NBTI model: Stress, recovery, frequency, duty cycle and process dependence
2013
IRPS | International Reliability Physics Symposium
Sujay Desai
Subhadeep Mukhopadhyay
Nilesh Goel
N. Nanaware
B. Jose
K. Joshi
S. Mahapatra
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Citations (46)
A Comparative Study of Different Physics-Based NBTI Models
2013
IEEE Transactions on Electron Devices
S. Mahapatra
Nilesh Goel
Sujay Desai
Shashank Gupta
B. Jose
Subhadeep Mukhopadhyay
K. Joshi
Ankit Jain
Ahmad Ehteshamul Islam
Muhammad Ashraful Alam
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Citations (233)
1