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S. W. Seo
S. W. Seo
SK Hynix
NAND gate
Electronic engineering
Materials science
Cycling
Embedded system
2
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New erase verify scheme for improving the cycling endurance of 2xnm NAND flash cell
2012
The Japan Society of Applied Physics
Jun-Ki Kim
Tae-Un Youn
S. W. Seo
N. Park
S. Yi
E. Park
Hyung Seok Kim
Hong Seon Yang
Keum-Hwan Noh
Sung Kye Park
Seokkiu Lee
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The Influence of Mechanical Stress on Data Retention in Advanced NAND Flash
2009
The Japan Society of Applied Physics
S. W. Seo
H. Oh
Y. Yang
S. Yi
Suk-Ki Kim
P. Kim
Dong-Duk Lee
Hong Seon Yang
Ho Seok Lee
Myoung Kwan Cho
Kun Ok Ahn
Yo-Hwan Koh
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