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Ranveig Flatabø
Ranveig Flatabø
University of Bergen
Optics
Analytical chemistry
Helium
Materials science
Depth of field
7
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28
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Exploring proximity effects and large depth of field in helium ion beam lithography: large-area dense patterns and tilted surface exposure
2018
Nanotechnology
Ranveig Flatabø
A. Agarwal
Richard G. Hobbs
Martin M. Greve
Bodil Holst
Karl K. Berggren
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Citations (9)
Fast resolution change in neutral helium atom microscopy
2018
Review of Scientific Instruments
Ranveig Flatabø
S. D. Eder
A. K. Ravn
B. Samelin
Martin M. Greve
Thomas Reisinger
Bodil Holst
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Light absorption and scattering of 40–170 nm gold nanoparticles on glass substrates
2017
Journal of Vacuum Science & Technology. B. Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena
Ranveig Flatabø
Vårin Renate Andvik Holm
Håkon Eidsvåg
Bodil Holst
Martin M. Greve
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Atom sieve for nanometer resolution neutral helium microscopy
2017
Journal of Vacuum Science & Technology. B. Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena
Ranveig Flatabø
Martin M. Greve
S. D. Eder
Matthias Kalläne
Adrià Salvador Palau
Karl K. Berggren
Bodil Holst
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Citations (4)
絶縁基板上の金属ナノ構造のための走査電子顕微鏡における帯電効果の系統的研究【Powered by NICT】
2017
Journal of Microscopy
Ranveig Flatabø
A. Coste
Martin M. Greve
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