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Y. Sato
Y. Sato
Mitsubishi Electric
Power cycling
Engineering
Reliability engineering
Automotive engineering
Interconnection
2
Papers
1
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0
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Analytical calculation method of effect of interconnect layer damage on power cycling lifetime
2019
Microelectronics Reliability
Y. Sato
K. Yamazaki
Y. Uchida
N. Sakai
Y. Ito
H. Kobayashi
S. Soda
K. Nishikawa
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Upgrade of the 3-MeV Linac for testing of Accelerator Components at J-PARC
2019
Y. Kondo
T. Morishita
K.Hirano
T. Ito
N. Kikuzawa
R. Kitamura
H. Oguri
K. Ohkoshi
S. Shinozaki
K. Shinto
Z. Fang
Y. Fukui
K. Futatsukawa
K. Ikegami
Tomoaki Miyao
K. Nanmo
M. Otani
Takanori Shibata
T. Hori
Y. Nemoto
Y. Sato
F. Kobayashi
D. Takahashi
R. Tasaki
Y. Ito
Y. Kato
T Ishiyama
Yuki Sawabe
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1