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Mak Kulkarni
Mak Kulkarni
Optoelectronics
Dopant
Materials science
CMOS
MOSFET
4
Papers
53
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A Method of MOSFET Dopant Profile Prediction and its Use in Transistor Design
1998
Joseph C. Davis
Mak Kulkarni
G Pollack
Sharad Saxena
K Vasanath
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Simple Method of Characterizing CMOS Channel Dopant Profiles Using CV Technique
1998
Joseph C. Davis
Chenjing Lucille Fernando
D Kapila
Mak Kulkarni
G Pollack
Karthik Vasanth
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Physical oxide thickness extraction and verification using quantum mechanical simulation
1997
IEDM | International Electron Devices Meeting
C. Bowen
Chenjing Lucille Fernando
Gerhard Klimeck
Amitava Chatterjee
Dan Blanks
Roger K. Lake
Jerry C. Hu
Joseph C. Davis
Mak Kulkarni
Sunil V. Hattangady
Ih-Chin Chen
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Citations (50)
Dopant Fluctuations and Quantum Effects in Sub-0.1um CMOS
1997
R. Chris Bowen
Chenjing Lucille Fernando
Gerhard Klimeck
Amitava Chatterjee
Daniel F. Blanks
Roger K. Lake
J. M. Woodall
Joseph G. Davis
Mak Kulkarni
Sunil V. Hattangady
Ih-Chin Chen
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Citations (3)
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