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S. N.Gavale
S. N.Gavale
Chalcogenide
Scanning electron microscope
Nanocrystalline material
Thin film
Tellurium
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XPS characterization and opto structural study of chemically deposited Sb (III) doped Bi2(Te1-xSex)3 thin films
2012
Archives of Physics Research
S.M. Patil
S. N.Gavale
R.K. Mane
N.S. Patil
Sawanta S. Mali
P.S. Patil
Popatrao N. Bhosale
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