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S. Race
S. Race
ETH Zurich
MOSFET
Die (integrated circuit)
Thermal resistance
Temperature measurement
Materials science
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Accuracy of Thermal Analysis for SiC Power Devices
2021
IRPS | International Reliability Physics Symposium
S. Race
Thomas Ziemann
S. Tiwari
Ivana Kovacevic-Badstuebner
Ulrike Grossner
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