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Prasenjit Chowdhury
Prasenjit Chowdhury
University of Texas at Austin
Leakage (electronics)
Physics
Oxide
Analytical chemistry
SILC
6
Papers
142
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Improvement of ultrathin gate oxide and oxynitride integrity using fluorine implantation technique
1997
Applied Physics Letters
Prasenjit Chowdhury
Anthony I. Chou
Kiran Kumar
Chuan Lin
Jack C. Lee
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Citations (24)
Leakage Current, Reliability Characteristics, and Boron Penetration of Ultra-Thin (32-36A) 02-Oxides and N2O/NO Oxynitrides
1996
IEDM | International Electron Devices Meeting
Chuan Lin
Anthony I. Chou
Kiran Kumar
Prasenjit Chowdhury
Jack C. Lee
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Citations (8)
Leakage current, reliability characteristics, and boron penetration of ultra-thin (32-36 /spl Aring/) O/sub 2/-oxides and N/sub 2/O/NO oxynitrides
1996
IEDM | International Electron Devices Meeting
Chuan Lin
Anthony I. Chou
Kiran Kumar
Prasenjit Chowdhury
Jack C. Lee
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Citations (3)
Breakdown mechanisms and stress-induced leakage current in ultra-thin oxides and N/sub 2/O oxynitrides
1995
BUGIMS | Biennial University/Government/Industry Microelectronics Symposium
Anthony I. Chou
Kafai Lai
Kiran Kumar
Prasenjit Chowdhury
Ming-Yin Hao
Wei Ming Chen
Mark Gardner
Jim Fulford
Jack C. Lee
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