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Cc Theron
Cc Theron
Nucleation
Rutherford backscattering spectrometry
Thin film
Sheet resistance
Activation energy
3
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23
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Nucleation and diffusion during growth of ternary Co1−xNixSi2 thin films studied by complementary techniques in real time
2008
Journal of Applied Physics
Dries Smeets
Jelle Demeulemeester
K. De Keyser
Davy Deduytsche
Christophe Detavernier
C.M. Comrie
Cc Theron
Christian Lavoie
André Vantomme
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Citations (13)
Simultaneous real-time x-ray diffraction spectroscopy, Rutherford backscattering spectrometry, and sheet resistance measurements to study thin film growth kinetics by Kissinger plots
2008
Journal of Applied Physics
Dries Smeets
Jelle Demeulemeester
Davy Deduytsche
Christophe Detavernier
C. M. Comrie
Cc Theron
Christian Lavoie
André Vantomme
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Citations (10)
Controlled phase formation by using a diffusion barrier
2000
Cc Theron
Annelies Falepin
Stefan Degroote
J Dekoster
André Vantomme
Guido Langouche
Hs de Waal
R. Pretorius
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