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Alain Sireuil
Alain Sireuil
Nanotechnology
Inert gas
Materials science
Image resolution
Ion
1
Papers
5
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NanoFab SIMS: High Spatial Resolution Imaging and Analysis Using Inert-Gas Ion Beams
2019
Microscopy Today
Sybren Sijbrandij
Alexander Lombardi
Alain Sireuil
Fouzia Khanom
Brett B. Lewis
Christelle Guillermier
Doug Runt
John Notte
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Citations (5)
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