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T. Gotszalk

Wrocław University of Technology

231

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2426

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Layer number dependence of the work function and optical properties of single and few layers MoS2: effect of substrate

2019 Nanotechnology
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Metrological 2iOF fibre-optic system for position and displacement measurement with 31 pm resolution

2018 Review of Scientific Instruments
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Electromagnetic cantilever reference for the calibration of optical nanodisplacement systems

2018 Sensors and Actuators A-physical
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Evaluation of mechanical properties of carbon coatings synthesised in radio frequency plasma on PDMS

2018 Surface & Coatings Technology
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Resolution improvement in electromagnetically actuated Wheatstone bridge configuration micromechanical resonators

2018 Sensors and Actuators A-physical
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Quasi in-situ observation of the elastic properties changes of the graphene–low-density polyethylene composites

2018 Diamond and Related Materials
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New design of the cantilevers for radiation pressure investigations

2018 Microelectronic Engineering
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Thermomechanically and electromagnetically actuated piezoresistive cantilevers for fast-scanning probe microscopy investigations

2018 Sensors and Actuators A-physical
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Magnetoelectric versus thermal actuation characteristics of shear force AFM probes with piezoresistive detection

2017 Measurement Science and Technology
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A low-noise measurement system for scanning thermal microscopy resistive nanoprobes based on a transformer ratio-arm bridge

2017 Measurement Science and Technology
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