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Jk Farrer
Jk Farrer
Cathode ray
Electron backscatter diffraction
Angle of incidence
Materials science
Crystallography
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EBSD pattern collection and orientation mapping at normal incidence to the electron beam
2003
Microscopy and Microanalysis
David J. Dingley
Jk Farrer
Matthew M. Nowell
D. Dingley
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