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T. Toledo
T. Toledo
École centrale de Lyon
Dielectric strength
Dielectric
Permittivity
Excitation
Material properties
1
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Field distribution measurement and simulation of stress control materials for cable accessories
2004
ICSD | IEEE International Conference on Solid Dielectrics
L. Bayón
F. Buret
C. Koelblin
T. Toledo
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Citations (6)
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