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Beryl Fernandez
Beryl Fernandez
Indian Institute of Technology Bombay
Negative-bias temperature instability
Threshold voltage
Electronic engineering
Physics
Kinetic theory
3
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27
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A Stochastic Modeling Framework for NBTI and TDDS in Small Area p-MOSFETs
2018
SISPAD | International Conference on Simulation of Semiconductor Processes and Devices
R Anandkrishnan
S. Bhagdikar
N Choudhury
Rakesh P Rao
Beryl Fernandez
A. Chaudhury
Narendra Parihar
S. Mahapatra
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Citations (4)
Consistency of the Two Component Composite Modeling Framework for NBTI in Large and Small Area p-MOSFETs
2017
IEEE Transactions on Electron Devices
Ankush Chaudhary
Beryl Fernandez
Narendra Parihar
S. Mahapatra
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Citations (21)
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