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B. Brycki
B. Brycki
Sarnoff Corporation
Thin film
Sheet resistance
Analytical chemistry
Electrical resistivity and conductivity
Microwave
3
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172
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Microwave properties of highly oriented YBa2Cu3O7−x thin films
1990
Applied Physics Letters
A. Inam
X. D. Wu
L. Nazar
M. S. Hegde
C. T. Rogers
T. Venkatesan
R.W. Simon
K. Daly
H. Padamsee
J. Kirchgessner
D. Moffat
D. Rubin
Q.S. Shu
D. Kalokitis
Aly E. Fathy
V. Pendrick
R. Brown
B. Brycki
E. Belohoubek
L. Drabeck
G. Grüner
R. H. Hammond
F. Gamble
B. M. Lairson
John C. Bravman
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Citations (115)
Measurement of microwave surface resistance of patterned superconducting thin films
1990
Journal of Electronic Materials
D. Kalokitis
Aly E. Fathy
V. Pendrick
R. Brown
B. Brycki
E. Belohoukek
L. Nazar
B. J. Wilkens
T. Venkatesan
A. Inam
X. D. Wu
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Citations (39)
Bimorph‐driven x–y–z translation stage for scanned image microscopy
1987
Review of Scientific Instruments
James R. Matey
R. S. Crandall
B. Brycki
G.A.D. Briggs
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Citations (18)
1