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F.I. Hoeseni
F.I. Hoeseni
Atomic physics
Secondary electrons
Spectrum analyzer
Cathode ray
Beamline
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Characterization of electron-beam- and EUV photon-induced secondary electron emission
2016
F.I. Hoeseni
A.M.M.G. Theulings
K. Hagen
J. van Veldhoven
D.J. Maas
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