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Zhu Ming

China Academy of Space Technology

6

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Single-Event Effects in Power MOSFETs: Physical Mechanism and Hardening through 3D Simulations

2018 ICC | International Conference on Circuits
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Research on single event upset cross-section of DICE SRAM

2017 PSHMC | Prognostics and System Health Management Conference
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Single Event Upset rate determination for 65 nm SRAM bit-cell in LEO radiation environments

2017 Microelectronics Reliability
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Based on improved subset sampling algorithm for SEU physical simulation

2017 ICC | International Conference on Circuits
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重イオン弾性散乱に起因するDICE SRAM SEUの定量的分析

2016 IEEE Transactions on Nuclear Science
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