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likang
likang
Xidian University
Condensed matter physics
NMOS logic
Drain-induced barrier lowering
Gate dielectric
Physics
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Hot-carrier degradation for 90 nm gate length LDD-NMOSFET with ultra-thin gate oxide under low gate voltage stress
2007
Chinese Physics
Haifeng Chen
Yue Hao
maxiaohua
likang
Jinyu Ni
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