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Guohua Qui
Guohua Qui
Charge density
Gate dielectric
Dielectric
Analytical chemistry
Leakage (electronics)
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Electrical conduction and dielectric breakdown in aluminum oxide insulators on silicon
2000
IEEE Transactions on Electron Devices
J. Kolodzey
Enam Chowdhury
T. N. Adam
Guohua Qui
I. Rau
J. O. Olowolafe
John S. Suehle
Yuan Chen
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Citations (173)
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