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Shunji Deguchi
Shunji Deguchi
JEOL Ltd.
High-resolution transmission electron microscopy
Analytical chemistry
Materials science
Scanning confocal electron microscopy
Energy filtered transmission electron microscopy
6
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Simultaneous Observation of Millisecond Dynamics in Atomistic Structure, Force and Conductance on the Basis of Transmission Electron Microscopy : Surface, Interfaces, and Films
2001
Japanese Journal of Applied Physics
Tokushi Kizuka
Hajime Ohmi
Takao Sumi
Katsuyoshi Kumazawa
Shunji Deguchi
Mikio Naruse
Satoru Fujisawa
Shinya Sasaki
Akira Yabe
Yuji Enomoto
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Simultaneous Observation of Millisecond Dynamics in Atomistic Structure, Force and Conductance on the Basis of Transmission Electron Microscopy
2001
Japanese Journal of Applied Physics
Tokushi Kizuka
Hajime Ohmi
Takao Sumi
Katsuyoshi Kumazawa
Shunji Deguchi
Mikio Naruse
Satoru Fujisawa
Shinya Sasaki
Akira Yabe
Yuji Enomoto
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Citations (73)
Direct Atomistic Observation of Grain Boundary Sliding II. Silicon Including Boundary Glass Phase
1999
Materials Science Forum
Tokushi Kizuka
K Hosoki
Shunji Deguchi
Mikio Naruse
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Citations (3)
Direct atomistic observation of grain boundary sliding. I. Gold
1999
Materials Science Forum
Tokushi Kizuka
M. Mizutani
Shunji Deguchi
Mikio Naruse
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Citations (2)
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