author-photo

Derek J. Gardiner

Northumbria University

50

Papers

918

Citations

Citation Trend

Filter By

Papers (32) Sort By

Journal Conference Others

Stress Imaging Alumina Corrosion Scales using Piezofluorescence Microspectroscopy

2003 Microscopy and Microanalysis
Show All
- Source
- Cite
- Save
Citations (0)
A comparison of laser- and furnace-annealed polysilicon structure

2002 Semiconductor Science and Technology
Show All
- Source
- Cite
- Save
Citations (8)
Depth profiling variously deposited LPCVD polysilicon films using Raman microscopy

2001 Semiconductor Science and Technology
Show All
- Source
- Cite
- Save
Citations (12)
Raman and finite-element analysis of a mechanically strained silicon microstructure

2001 Journal of Micromechanics and Microengineering
Show All
- Source
- Cite
- Save
Citations (16)
Raman spectroscopy as a mapping tool for localized strain in microengineered structures

1997 Journal of Materials Science Letters
Show All
- Source
- Cite
- Save
Citations (3)
Stress and Structural Images of Microindented Silicon by Raman Microscopy

1997 Applied Spectroscopy
- Michael Bowden
- Derek J. Gardiner
Show All
- Source
- Cite
- Save
Citations (40)
Monitoring the quality of diamond films using Raman spectra excited at 514.5 nm and 633 nm

1996 Diamond and Related Materials
Show All
- Source
- Cite
- Save
Citations (169)
Maximum Entropy Methods Applied to Simulated and Observed Raman Spectra

1996 Applied Spectroscopy
Show All
- Source
- Cite
- Save
Citations (14)
Thermal degradation of polyurethane-backed poly(vinyl chloride) studied by Raman microline focus spectrometry

1994 Polymer
Show All
- Source
- Cite
- Save
Citations (14)
Stress and crystallinity in 〈100〉, 〈110〉, and 〈111〉 oriented diamond films studied using Raman microscopy

1994 Applied Physics Letters
Show All
- Source
- Cite
- Save
Citations (15)