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Koichi Kakuda
Koichi Kakuda
Engineering
Electrical engineering
Electronic engineering
Ground
Voltage
7
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3
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Verification of suitability of the AAN shown in Fig. G.3 of CISPR 32 for conducted emission measurement on single and two-pair unscreened balanced cables
2019
EMC | International Symposium on Electromagnetic Compatibility
Nozomi Miyake
Koichi Kakuda
Hidenori Muramatsu
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Considerations for the Use of Handheld Image Viewers: The Report of AAPM Task Group 260
2018
Aldo Badano
Nicholas Bevins
Michael J. Flynn
Ogan Gurel
M. Hasegawa
Ing. Juergen Heckel
Koichi Kakuda
jessica lamb
Steve G. Langer
Andy Masia
J. Ross Mitchell
Balázs Nagy
John Penczek
Gert Van Hoey
Kyle Peterson
George Redmond
Girish Srinivasan
Peter M. Steven
Rachel Toomey
A Walz‐Flannigan
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Comparison of configurations for conducted emission measurement specified in CISPR 32 and CISPR 13
2017
EMC | International Symposium on Electromagnetic Compatibility
Nozomi Miyake
Koichi Kakuda
Yoshiaki Hiratsuka
Hidenori Muramatsu
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Deviations of conducted disturbance voltages measured with AMN due to differences in height of the AMN and its grounding conditions
2014
EMC | International Symposium on Electromagnetic Compatibility
Yoshiharu Akiyama
Koichi Kakuda
Toshiki Shimasaki
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Deviations of Conducted Disturbance Voltages Measured with AMN Due to Differences in Height of the AMN and Its Grounding Conditions
2014
Yoshiharu Akiyama
Koichi Kakuda
Toshiki Shimasaki
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Radiated ESD noise of 5 GHz-band from walkers
2006
EOS/ESD | Electrical Overstress/Electrostatic Discharge Symposium
Osamu Aoki
Toshiaki Ono
Koichi Kakuda
Masamitsu Honda
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