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Young Tak Roh
Young Tak Roh
KAIST
MOSFET
Analytical chemistry
Absorbed dose
Leakage (electronics)
Electronic engineering
3
Papers
23
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Layout Modification of a PD-SOI n-MOSFET for Total Ionizing Dose Effect Hardening
2019
IEEE Transactions on Electron Devices
Young Tak Roh
Hee-Chul Lee
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Citations (6)
Local Electro-Thermal Annealing for Repair of Total Ionizing Dose-Induced Damage in Gate-All-Around MOSFETs
2016
IEEE Electron Device Letters
Junyoung Park
Dong-Il Moon
Hagyoul Bae
Young Tak Roh
Myeong-Lok Seol
Byung-Hyun Lee
Chang-Hoon Jeon
Hee-Chul Lee
Yang-Kyu Choi
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Citations (16)
TID and SEE hardened n-MOSFET layout on a bulk silicon substrate which combines a DGA n-MOSFET and a guard drain
2015
NSS/MIC | Nuclear Science Symposium and Medical Imaging Conference
Young Tak Roh
Hee-Chul Lee
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Citations (1)
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