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John J. Plombon

Intel

17

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439

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A Selectively Colorful yet Chilly Perspective on the Highs and Lows of Dielectric Materials for CMOS Nanoelectronics

2020 IEDM | International Electron Devices Meeting
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Experimental demonstration of integrated magneto-electric and spin-orbit building blocks implementing energy-efficient logic

2019 IEDM | International Electron Devices Meeting
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Nickel suicide for interconnects

2015 IITC | International Interconnect Technology Conference
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Demonstration of new planar capacitor (PCAP) vehicles to evaluate dielectrics and metal barrier thin films

2015 IITC | International Interconnect Technology Conference
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Nickel silicide for interconnects

2015 IITC | International Interconnect Technology Conference
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Electron transport properties of sub-3-nm diameter copper nanowires

2015 Physical Review B
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Demonstration of a sidewall capacitor to evaluate dielectrics and metal barrier thin films

2014 IITC | International Interconnect Technology Conference
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Connecting Single Molecule Electrical Measurements to Ensemble Spectroscopic Properties for Quantification of Single-Walled Carbon Nanotube Separation

2009 Journal of the American Chemical Society
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Al Diffusion in Polycrystalline Cu

2008 MRS Proceedings
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High-frequency electrical properties of individual and bundled carbon nanotubes

2007 Applied Physics Letters
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Citations (177)