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R. D’Alpaos
R. D’Alpaos
Electronic engineering
Degradation (geology)
Thin-film transistor
Voltage
Organic electronics
4
Papers
15
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Thermal Stress Effects on Organic-Thin-Film-Transistors
2016
Nicola Wrachien
Lorenzo Torto
N. Lago
Antonio Rizzo
Gaudenzio Meneghesso
R. D’Alpaos
Gianluca Generali
Guido Turatti
Michele Muccini
Andrea Cester
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Reliability study of organic complementary logic inverters using constant voltage stress
2015
Solid-state Electronics
Nicola Wrachien
Andrea Cester
N. Lago
Antonio Rizzo
R. D’Alpaos
Andrea Stefani
Guido Turatti
Michele Muccini
Gaudenzio Meneghesso
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Citations (5)
Stress-induced degradation of p- and n-type organic thin-film-transistors in the ON and OFF states
2014
Microelectronics Reliability
Nicola Wrachien
Andrea Cester
N. Lago
Gaudenzio Meneghesso
R. D’Alpaos
Andrea Stefani
Guido Turatti
Michele Muccini
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Citations (2)
Effects of constant voltage stress on p- and n-type organic thin film transistors with poly(methyl methacrylate) gate dielectric
2013
Microelectronics Reliability
Nicola Wrachien
Andrea Cester
D. Bari
Raffaella Capelli
R. D’Alpaos
Michele Muccini
Andrea Stefani
Guido Turatti
Gaudenzio Meneghesso
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Citations (8)
1