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Graham A. Cooke
Graham A. Cooke
Analytical chemistry
Chemistry
Secondary ion mass spectrometry
Dopant
Ion beam
3
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20
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Analysis of useful ion yield for Si in GaN by secondary ion mass spectrometry
2020
Journal of Vacuum Science & Technology B
M. K. Indika Senevirathna
Mark Vernon
Graham A. Cooke
Garnett B. Cross
Alexander Kozhanov
Michael D. Williams
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