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J.D. Wicker
J.D. Wicker
Reliability engineering
Stuck-at fault
Fault coverage
Automatic test pattern generation
Electronic engineering
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Defect-oriented testing and defective-part-level prediction
2001
IEEE Design & Test of Computers
Jennifer Dworak
J.D. Wicker
Sooryong Lee
Michael R. Grimaila
M.R. Mercer
Kenneth M. Butler
B. Stewart
Li-C. Wang
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