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M. D. Moyer

Xerox

14

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252

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Kinetics of Carrier-Induced Metastable defect Formation in Hydrogenated Amorphous Silicon

1988 MRS Proceedings
- Warren B. Jackson
- M. D. Moyer
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Citations (10)
Optically-Heated Zone Crystal Growth of Silicon Thin Films on Amorphous Substrates

1985
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Defect Reduction by Tilted Zone Crystallization of Patterned Silicon Films on Fused Silica

1983 MRS Proceedings
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Detection of Electronic Defects in Strip-Heater Crystallized Silicon Thin Films

1982 MRS Proceedings
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Thin-Film Transistors in CO 2 -Laser Crystallized Silicon Films On Fused Silica

1982 MRS Proceedings
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Properties of Patterned and CW Laser-Crystallized Silicon Films on Amorphous Substrates

1981
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Deuterium at the Si‐SiO2 interface detected by secondary‐ion mass spectrometry

1981 Applied Physics Letters
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CORRELATED ELECTRICAL AND MICROSTRUCTURAL STUDIES OF RECRYSTALLIZED SILICON THIN FILMS ON BULK GLASS SUBSTRATES.

1981 MRS Proceedings
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Grain boundaries in p‐n junction diodes fabricated in laser‐recrystallized silicon thin films

1981 Applied Physics Letters
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Hydrogenation of Defects at the Si-SiO2 Interface

1981
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Citations (2)