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Dustin Slisher
Dustin Slisher
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Computer science
Computer hardware
Electronic circuit
Digital electronics
Wafer testing
3
Papers
18
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Middle of Line: Challenges and Their Resolution for FinFET Technology
2020
ASMC | Advanced Semiconductor Manufacturing Conference
Shiv Kumar Mishra
Erik Geiss
Aditya Kumar
Arkadiusz Malinowski
Gao Wen-zhi
Wenhe Lin
Bangun Indajang
Dustin Slisher
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Device ArrayScribe Characterization Vehicle TestChip forUltra FastProduct WaferVariability Monitoring
2007
International Conference on Microelectronic Test Structures
Christopher Hess
H. Karbasi
Senthil Subramanian
Michele Quarantelli
Stefano Tonello
Dustin Slisher
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Device Array Scribe Characterization Vehicle Test Chip for Ultra Fast Product Wafer Variability Monitoring
2007
ICMTS | International Conference on Microelectronic Test Structures
Christopher Hess
Sharad Saxena
H. Karbasi
Senthil Subramanian
Michele Quarantelli
Angelo Rossoni
Stefano Tonello
Sa Zhao
Dustin Slisher
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Citations (18)
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