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Su-Kon Bae
Su-Kon Bae
Samsung
Transistor
Electronic engineering
Planar
Density of states
MOSFET
2
Papers
40
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Negative bias temperature instability in triple gate transistors
2004
IRPS | International Reliability Physics Symposium
Shigenobu Maeda
Jung-A Choi
Jeong Hwan Yang
You Seung Jin
Su-Kon Bae
Young-Wug Kim
Kwang Pyuk Suh
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Citations (33)
Fully working 1.25 /spl mu/m/sup 2/ 6T-SRAM cell with 45 nm gate length triple gate transistors
2003
IEDM | International Electron Devices Meeting
Jeong Hwan Yang
You Seung Jin
Hyae-ryoung Lee
Kyoung-Seok Rha
Jung-A Choi
Su-Kon Bae
S. Maeda
Young-Wug Kim
Kwang Pyuk Suh
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Citations (7)
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