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K. C. Findlay
K. C. Findlay
Norwich Research Park
Scanning electron microscope
Ion beam
Analytical chemistry
Surface layer
Focused ion beam
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A technique for improved focused ion beam milling of cryo‐prepared life science specimens
2007
Journal of Microscopy
M. Hayles
Debbie J. Stokes
Daniel Woodrow Phifer
K. C. Findlay
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Citations (98)
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